Semiconductor Inspection Equipment PCP-102SL
Eliminate cumulative errors in contact due to stage index, initial settings, temperature, etc., with XY position correction!
The PCP-102SL is a prober developed to enable the inspection of thin wafers in addition to standard wafers. It performs automatic transport from the cassette, pre-alignment, fine alignment, and probing (inspection). 【Features】 - Eliminates cumulative errors in contact due to stage indexing, initial settings, temperature, and more. - Multi-probing inspection significantly improves the throughput of the inspection process. *For more details, please request materials or view the PDF data available for download.
- Company：プラムファイブ
- Price：Other
